X-ray circular magnetic dichroism is used to image magentization of magentic layers. Measurements in the EUV range, allows element selective imaging at the absorbtion edges of common materials as Fe,Co and Ni.
Image: FZ Jülich | Daniel Wilson
Measuring the specular reflectivity of a layered sample at various wavelengths and incidence angles, one can determine the key parameters of every layer, namely thickness, density, chemical bonds and local symmetry. Our Panter setup offers this measurements in a compact, laboratory-scale device.
Image: RWTH EUV | Maksym Tryus
Scatterometrie is a methode to investigate periodic structures on surfaces. The short wavelength of EUV light enables on to make even nanometer small errors in the surface structure visible and investigate normally transparent materials.
Image: RWTH EUV | Aleksiy Maryasov